薄膜厚度测量

Film Thickness Measurement Instrument

Instrument

Product characteristics

Application examples

Film Thickness Measurement Instrument

Instrument

Product characteristics

Application examples

Film Thickness Measurement Instrument

Ultra high precision/Multi layer measurement/Rich scenes

high-precision Film thickness Mapping Mode

Accurate deviation correction to achieve ultra-high resolution; Millisecond level sampling frequency, 2-3 times higher than traditional film thickness gauges, more suitable for online use! Support Mapping mode, automatic and fast measurement, single point

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Product characteristics

Ultra high precision

Resolution 0.1Å

Multi layer measurement

Maximum up to measure 10 layers

Multiple Application Scenarios

Offline/Online/Mapping Multiple Application Scenarios

Application examples

Film thickness measurement

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Film Thickness Measurement AF Series

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