白光干涉仪AM系列

White Light Interferometer AM Series

Roughness/Step Height

Product characteristics

Application examples

White Light Interferometer AM Series

Roughness/Step Height

Product characteristics

Application examples

White Light Interferometer AM Series

WLI 3D Profiler

Roughness 3D topography

AM-7000 can be used for sub nanometer level measurement of various precision devices and material surfaces, obtaining surface 3D morphology in the form of "surface" through specialized software for processing and analysis, with a maximum RMS repeatability

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WLI 3D Profiler

WLI 3D Profiler

WLI 3D Profiler

Product characteristics

Unique designed LED light source

The minimum central field wavelength is 465nm

High sensitivity and high-speed sensor

Highly transparent products with reflectivity as low as 0.02% can easily collect information and measure

Ultra large angle characteristic

The maximum angle characteristic of the smooth surface is 53 °, and the local profile inclination angle can reach 90 °

Full range white light interference lens

Paired with the industry's top white interference lens, the optical path is adapted and verified before leaving the factory. Special optical paths can be paired with a 115x lens with a numerical aperture NA of 0.8

Application examples

Roughness

0.05nm lens roughness

Gear splicing measurement roughness

Roller surface roughness

Surface roughness of cosmetic mica

Measurement of Metal Surface Texture

Flatness

Ultra smooth flatness measurement

3D Topographiy

Measurement of wafer surface etching

Surface morphology and structure of silicon wafer

Surface of capacitive components

Wafer cutting depth

Cylindrical mirror

Scratches on the glass cover of the mobile phone

Micro lens compound eye

PCB size measurement

Step Height

Character depth

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White-light interference 3D Surface Profilers AM Series

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