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Sensor
Laser Displacement Sensor
3D Laser Profiler Sensor
Spectral Confocal Displacement Sensor
Image Measurement
Image Dimension Measurement System
Roughness/Step Height
White Light Interferometer AM Series
Wafer 3D inspection solutions WM Series
Wafer 3D inspection solutions WM Series
IC Substrate 3D Inspection Solutions EP Series
Digital Microscope
Super Large Depth of Field Digital Microscope
Instrument
Ellipsometer
Film Thickness Measurement Instrument
Industry
New energy
Electronics Products
Semiconductor
Materials
Tools
Precise optics
Precise Machining
Display panel
Medical
Application
Roughness
Height/Height difference
3D topography
3D size
Swing vibration
Positioning
2D size
Film thickness
Flatness
Thickness
Step height
Contour
Request for demonstration/testing
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Case Study
Knowledge articles
Company Profile
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Home
Product Center
Sensor
Image Measurement
Roughness/Step Height
Digital Microscope
Instrument
Industry Application
Industry
Application
Service Support
Request for demonstration/testing
Download
Contact us
News
News
Case Study
Knowledge articles
About us
Company Profile
Corporate Culture
Milestones
Honors
Partners
Recruitment
Contact us
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Product Center
Product Center
Atometrics provides professional, internationally leading testing equipment and technical services. The products involved include: sensors, visual measurement, roughness/step height measurement/3D topography, microscopes, and measuring instruments.
All
Sensor
Laser Displacement Sensor
3D Laser Profiler Sensor
Spectral Confocal Displacement Sensor
Image Measurement
Image Dimension Measurement System
Roughness/Step Height
White Light Interferometer AM Series
Wafer 3D inspection solutions WM Series
Wafer 3D inspection solutions WM Series
IC Substrate 3D Inspection Solutions EP Series
Digital Microscope
Super Large Depth of Field Digital Microscope
Instrument
Ellipsometer
Film Thickness Measurement Instrument
IC Substrate 3D Inspection Solutions EP Series
Roughness
Flatness
3D topography
Learn More
Wafer 3D inspection solutions WM Series
Roughness
Film thickness
3D topography
Height difference
Learn More
Wafer 3D inspection solutions WM Series
Roughness
Step Height
3D Size
Learn More
White Light Interferometer AM Series
Roughness
3D topography
Learn More